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Abstract

Thin film synthetic diamond promises to be the next semiconductor material, if the manufacturing processes which produce it can be controlled. Solid state nuclear magnetic resonance (NMR) using magic angle spinning (MAS) is used to measure the content of hydrogen in diamond which controls the resistivity of the diamond thin films. Spectral results are presented for proton NMR of thin film synthetic diamond. Experimental calibration techniques using BaF2 as the hydrogen standard will be discussed, as well as acquisition times, pulsing sequences, spinning rates, and rotor composition.

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