Techniques for using oxide thickness measurements for predicting crack formation and growth history in high-temperature metallic components

Inventors

Ashok Saxena, University of Arkansas, Fayetteville
Ralph Edward Huneycutt IV, University of Arkansas, Fayetteville
Kee Bong Yoon

Document Type

Patent

Publication Date

4-28-2020

Abstract

A method and system to develop the age and history of a crack by exposing a specimen or component to varying predetermined temperature range that covers the designated service temperatures and measuring the thickness of the oxide across the specimen along the thickness direction.

Department

Mechanical Engineering

Patent Number

US10634629

Application Number

US 20180340897 A1

Application Published

11-29-2018

Application Filed

5-23-2018

Assignee

Board of Trustees of the University of Arkansas (Little Rock, AR); Chun-Ang University Industry-Academic Cooperation Foundation (Seoul, KR)

Comments

Ashok Saxena, Department of Mechanical Engineering, University of Arkansas, Fayetteville, AR
Ralph E. Huneycutt, IV, Department of Mechanical Engineering, University of Arkansas, Fayetteville, AR

Citation

Saxena, A., Huneycutt, R. E., & Yoon, K. B. (2020). Techniques for using oxide thickness measurements for predicting crack formation and growth history in high-temperature metallic components. Patents Granted. Retrieved from https://scholarworks.uark.edu/pat/372