Date of Graduation
5-2020
Document Type
Dissertation
Degree Name
Doctor of Philosophy in Engineering (PhD)
Degree Level
Graduate
Department
Electrical Engineering
Advisor/Mentor
Smith, Scott C.
Committee Member
Di, Jia
Second Committee Member
Mantooth, H. Alan
Third Committee Member
Wu, Jingxian
Keywords
Asynchronous logic; Built-in self-test (BIST); Multi-Threshold NULL Convention Logic (MTNCL); NULL Convention Logic (NCL); Sleep Convention Logic (SCL)
Abstract
This dissertation proposes a Built-In Self-Test (BIST) hardware implementation for Multi-Threshold NULL Convention Logic (MTNCL) circuits. Two different methods are proposed: an area-optimized topology that requires minimal area overhead, and a test-performance-optimized topology that utilizes parallelism and internal hardware to reduce the overall test time through additional controllability points. Furthermore, an automated software flow is proposed to insert, simulate, and analyze an input MTNCL netlist to obtain a desired fault coverage, if possible, through iterative digital and fault simulations. The proposed automated flow is capable of producing both area-optimized and test-performance-optimized BIST circuits and scripts for digital and fault simulation using commercial software that may be utilized to manually verify or adjust further, if desired.
Citation
Sparkman, B. (2020). Built-In Self-Test (BIST) for Multi-Threshold NULL Convention Logic (MTNCL) Circuits. Graduate Theses and Dissertations Retrieved from https://scholarworks.uark.edu/etd/3613
